Vaunix Technology Corporation recently produced an insightful technical brief discussing handover/handoff testing using USB-based digital attenuators for complex and scalable fading simulations.
Traditional fading simulations have relied upon complex and expensive single-box testers, which are ultimately limited by the number of ports, internal hardware, and proprietary and inflexible software. Other methods for enabling fading simulations may also involve an array of manual or programmable attenuators set to operate in a timed sequence. However, these methods fail to provide the necessary level of reconfigurability, low costs, and ease of setup/control offered by modular and efficient USB-based digital attenuators.
The tech brief details the critical aspects of handover/handoff testing, and how recent technological advances have dramatically increased the complexity of such testing. The new height of handover/handoff testing also includes mixed wireless standards, such as cellular-to-WiFi and vice versa, as well as an expanded need for more fading channels.
Lastly, the brief explains how cost, time, and flexibility can all be improved with cutting-edge, USB-based digital attenuators. Vaunix has been producing such attenuators, and recently expanded attenuator offerings, for well over a decade and has extreme confidence in the quality and ability of its products to help achieve efficiency and success for its customers.